Information card for entry 2009556

Structure parameters

• Formula: Si Te Zr
• Calculated formula: Si Te Zr
• Title of publication: Structure of the layer compound ZrSiTe
• Authors of publication: Bensch, W.; Dürichen, P.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 1994
• Journal volume: 50
• Journal issue: 3
• Pages of publication: 346 - 348
• a: 3.6974 ± 0.0009 Å
• b: 3.6974 ± 0.0009 Å
• c: 9.508 ± 0.002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 129.98 ± 0.05 ų
• Cell temperature: 295 K
• Number of distinct elements: 3
• Hermann-Mauguin space group symbol: P 4/n m m
• Hall space group symbol: -P 4a 2a
• Goodness-of-fit parameter for significantly intense reflections: 1.3
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No