Information card for entry 2009742
| Chemical name |
1,1,2,3,3-pentamethyl-2,3,4,5,6,7-hexahydroinden-4-one |
| Formula |
C14 H22 O |
| Calculated formula |
C14 H22 O |
| SMILES |
C1(C(C(C2=C1CCCC2=O)(C)C)C)(C)C |
| Title of publication |
Crystal studies of musk compounds. X. 1,1,2,3,3-Pentamethyl-2,3,4,5,6,7-hexahydroinden-4-one |
| Authors of publication |
De Ridder, Dirk J. A.; Fraanje, Jan; Schenk, Henk; 1,1,2,3,3-pentamethyl-2,3,4,5,6,7-hexahydroinden-4-one |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1994 |
| Journal volume |
50 |
| Journal issue |
5 |
| Pages of publication |
755 - 757 |
| a |
13.327 ± 0.001 Å |
| b |
7.0693 ± 0.0009 Å |
| c |
14.115 ± 0.001 Å |
| α |
90° |
| β |
104.588 ± 0.009° |
| γ |
90° |
| Cell volume |
1286.9 ± 0.2 Å3 |
| Cell temperature |
231 K |
| Ambient diffraction temperature |
231 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.084 |
| Residual factor for significantly intense reflections |
0.084 |
| Weighted residual factors for all reflections |
0.11 |
| Weighted residual factors for significantly intense reflections |
0.11 |
| Goodness-of-fit parameter for all reflections |
0.268 |
| Goodness-of-fit parameter for significantly intense reflections |
0.268 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2009742.html