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Information card for entry 2009783
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Coordinates | 2009783.cif |
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Original IUCr paper | HTML |
Chemical name | (μ~3~-iodo)(μ~3~-tetraselenidotungstide)tris(dimethylphenylphosphinesilver) |
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Formula | C24 H33 Ag3 I P3 Se4 W |
Calculated formula | C24 H33 Ag3 I P3 Se4 W |
SMILES | [I]12[Ag]3([P](C)(C)c4ccccc4)[Se]4[W]5(=[Se])[Se]3[Ag]2([P](C)(C)c2ccccc2)[Se]5[Ag]14[P](C)(C)c1ccccc1 |
Title of publication | Synthesis and structure of [(μ~3~-I)(μ~3~-WSe~4~){Ag(PMe~2~Ph)}~3~] |
Authors of publication | Ansari, Mohammad A.; Bollinger, John C.; Christuk, Christopher C.; Ibers, James A. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1994 |
Journal volume | 50 |
Journal issue | 6 |
Pages of publication | 869 - 871 |
a | 13.488 ± 0.006 Å |
b | 13.488 ± 0.006 Å |
c | 65.5 ± 0.03 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 10320 ± 8 Å3 |
Cell temperature | 108 ± 2 K |
Ambient diffraction temperature | 108 ± 2 K |
Number of distinct elements | 7 |
Space group number | 167 |
Hermann-Mauguin space group symbol | R -3 c :H |
Hall space group symbol | -R 3 2"c |
Residual factor for all reflections | 0.074 |
Residual factor for significantly intense reflections | 0.05 |
Weighted residual factors for all reflections | 0.129 |
Weighted residual factors for significantly intense reflections | 0.121 |
Goodness-of-fit parameter for all reflections | 1.35 |
Goodness-of-fit parameter for significantly intense reflections | 1.47 |
Diffraction radiation wavelength | 0.7093 Å |
Diffraction radiation type | MoKα~1~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2009783.html
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