Information card for entry 2010670
Chemical name |
4,5-bis(ferrocenylmethylthio)-1,3-dithiole-2-one |
Formula |
C25 H22 Fe2 O S4 |
Calculated formula |
C25 H22 Fe2 O S4 |
SMILES |
[Fe]([cH]12)([cH]13)([cH]21)([cH]12)([cH]23)([cH]12)([cH]13)([cH]21)([cH]12)[c]23CSC1SC(=O)SC=1SC[c]12[Fe]([cH]13)([cH]21)([cH]12)([cH]23)([cH]12)([cH]13)([cH]21)([cH]12)[cH]23 |
Title of publication |
4,5-Bis(ferrocenylmethylthio)-1,3-dithiol-2-one |
Authors of publication |
Chohan, Zahid, H.; Howie, R. Alan; Wardell, James L.; Low, John Nicolson |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
2000 |
Journal volume |
56 |
Journal issue |
2 |
Pages of publication |
e46 - e46 |
a |
11.953 ± 0.002 Å |
b |
18.433 ± 0.004 Å |
c |
11.954 ± 0.002 Å |
α |
90° |
β |
114.86 ± 0.03° |
γ |
90° |
Cell volume |
2389.8 ± 1 Å3 |
Cell temperature |
150 ± 0.1 K |
Ambient diffraction temperature |
150 ± 0.1 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.155 |
Residual factor for significantly intense reflections |
0.056 |
Weighted residual factors for all reflections included in the refinement |
0.148 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.947 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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