Information card for entry 2010830
Chemical name |
4-[1-(phenylsulfonyl)indol-3-yl]-3a,4,5,9b-tetrahydro-3H-cyclopenta[c] quinoline |
Formula |
C26 H22 N2 O2 S |
Calculated formula |
C26 H22 N2 O2 S |
SMILES |
S(=O)(=O)(n1cc([C@@H]2Nc3ccccc3[C@@H]3C=CC[C@H]23)c2c1cccc2)c1ccccc1.S(=O)(=O)(n1cc([C@H]2Nc3ccccc3[C@H]3C=CC[C@@H]23)c2c1cccc2)c1ccccc1 |
Title of publication |
4-[1-(Phenylsulfonyl)indol-3-yl]-3a,4,5,9b-tetrahydro-3<i>H</i>-cyclopenta[<i>c</i>]quinoline |
Authors of publication |
Sankaranarayanan, R.; Velmurugan, D.; Shanmuga Sundara Raj, S.; Fun, Hoong-Kun; Babu, G.; Perumal, P.T. |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
2000 |
Journal volume |
56 |
Journal issue |
4 |
Pages of publication |
475 - 476 |
a |
11.4515 ± 0.0002 Å |
b |
8.6572 ± 0.0001 Å |
c |
22.6109 ± 0.0004 Å |
α |
90° |
β |
90.864 ± 0.001° |
γ |
90° |
Cell volume |
2241.34 ± 0.06 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.094 |
Residual factor for significantly intense reflections |
0.054 |
Weighted residual factors for all reflections included in the refinement |
0.149 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.019 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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