Information card for entry 2011785

Structure parameters

• Chemical name: cis-[Bis(diphenylphosphinomethyl)diphenylphosphine oxide-O,P]platinum(II) dinitrate dihydrate
• Formula: C50 H48 N2 O10 P4 Pt
• Calculated formula: C50 H48 N2 O10 P4 Pt
• SMILES: [Pt]12([P](CP(=[O]1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[P](CP(=[O]2)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.N(=O)(=O)[O-].N(=O)(=O)[O-].O.O
• Title of publication: [Ethylene-1,2-bis(diphenylphosphine)-<i>P</i>,<i>P</i>']dinitratoplatinum(II) and <i>cis</i>-bis[(diphenylphosphinomethyl)diphenylphosphine oxide-<i>O</i>,<i>P</i>]platinum(II) dinitrate dihydrate
• Authors of publication: Arendse, Malcolm J.; Anderson, Gordon K.; Rath, Nigam P.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 2001
• Journal volume: 57
• Journal issue: 3
• Pages of publication: 237 - 239
• a: 12.9843 ± 0.0002 Å
• b: 16.3998 ± 0.0002 Å
• c: 22.6979 ± 0.0003 Å
• α: 90°
• β: 92.81 ± 0.01°
• γ: 90°
• Cell volume: 4827.48 ± 0.12 ų
• Cell temperature: 213 ± 2 K
• Ambient diffraction temperature: 213 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.049
• Residual factor for significantly intense reflections: 0.031
• Weighted residual factors for all reflections included in the refinement: 0.069
• Goodness-of-fit parameter for all reflections included in the refinement: 1.09
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes