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Information card for entry 2012450
Preview
Coordinates | 2012450.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | μ~4~-oxo-hexa-μ-chloro-tetrakis[(2-methyl-2-thiazoline)copper(II)] |
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Formula | C16 H28 Cl6 Cu4 N4 O S4 |
Calculated formula | C16 H28 Cl6 Cu4 N4 O S4 |
SMILES | C1(C)=[N](CCS1)[Cu]123[O]45[Cu]6([N]7=C(SCC7)C)([Cl]1)[Cl][Cu]4([N]1=C(SCC1)C)([Cl][Cu]5([Cl]2)([Cl]6)[N]1=C(C)SCC1)[Cl]3 |
Title of publication | Hexa-μ-chloro-μ~4~-oxo-tetrakis[(4,5-dihydro-2-methyl-1,2-thiazole-κ<i>N</i>)copper(II)] |
Authors of publication | Bolos, C. A.; Christidis, P. C. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 1 |
Pages of publication | m29 - m30 |
a | 10.3705 ± 0.0018 Å |
b | 14.903 ± 0.002 Å |
c | 20.375 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3149 ± 0.9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.1708 |
Residual factor for significantly intense reflections | 0.0635 |
Weighted residual factors for significantly intense reflections | 0.1033 |
Weighted residual factors for all reflections included in the refinement | 0.127 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.901 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2012450.html
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