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Information card for entry 2012456
Preview
Coordinates | 2012456.cif |
---|---|
Structure factors | 2012456.hkl |
Original IUCr paper | HTML |
Chemical name | 1,2-Bis(4'-pyridyl)ethane‒1,1,1-tris(4-hydroxyphenyl)ethane (1/2) |
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Formula | C52 H48 N2 O6 |
Calculated formula | C52 H48 N2 O6 |
SMILES | n1ccc(cc1)CCc1ccncc1.Oc1ccc(cc1)C(c1ccc(cc1)O)(c1ccc(cc1)O)C.Oc1ccc(cc1)C(c1ccc(cc1)O)(c1ccc(cc1)O)C |
Title of publication | Adducts of 1,1,1-tris(4-hydroxyphenyl)ethane with 1,2-bis(4-pyridyl)ethane and 1,2-bis(4-pyridyl)ethene: continuously interwoven structures in three dimensions |
Authors of publication | Zakaria, Choudhury M; Ferguson, George; Lough, Alan J.; Glidewell, Christopher |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 1 |
Pages of publication | o1 - o5 |
a | 10.2076 ± 0.0002 Å |
b | 10.6559 ± 0.0002 Å |
c | 10.9341 ± 0.0002 Å |
α | 100.992 ± 0.0016° |
β | 109.453 ± 0.0014° |
γ | 101.67 ± 0.0011° |
Cell volume | 1054.49 ± 0.04 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0564 |
Residual factor for significantly intense reflections | 0.0439 |
Weighted residual factors for significantly intense reflections | 0.1136 |
Weighted residual factors for all reflections included in the refinement | 0.1226 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2012456.html
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Users of the data should acknowledge the original authors of the
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