Information card for entry 2012518
| Chemical name |
Bis(ethylenediamine)copper(II) bis(O,O'-diethyl dithiophosphato-S,S') |
| Formula |
C12 H36 Cu N4 O4 P2 S4 |
| Calculated formula |
C12 H36 Cu N4 O4 P2 S4 |
| SMILES |
C1C[NH2][Cu]2([NH2]1)[NH2]CC[NH2]2.P(=S)(OCC)(OCC)[S-].C(C)OP(OCC)(=S)[S-] |
| Title of publication |
Bis(ethylenediamine)copper(II) bis(<i>O</i>,<i>O</i>'-diethyl dithiophosphate) |
| Authors of publication |
Fun, Hoong-Kun; Hao, Qingli; Ma, Haibo; Yang, Xujie; Lu, Lude; Wang, Xin; Chantrapromma, Suchada; Razak, Ibrahim Abdul; Usman, Anwar |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2002 |
| Journal volume |
58 |
| Journal issue |
2 |
| Pages of publication |
m87 - m88 |
| a |
14.6683 ± 0.0003 Å |
| b |
6.9409 ± 0.0001 Å |
| c |
13.5889 ± 0.0001 Å |
| α |
90° |
| β |
111.157 ± 0.001° |
| γ |
90° |
| Cell volume |
1290.25 ± 0.03 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0741 |
| Residual factor for significantly intense reflections |
0.0452 |
| Weighted residual factors for significantly intense reflections |
0.0989 |
| Weighted residual factors for all reflections included in the refinement |
0.1059 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.919 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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