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Information card for entry 2012622
Preview
Coordinates | 2012622.cif |
---|---|
Structure factors | 2012622.hkl |
Original IUCr paper | HTML |
Chemical name | ethoxydinitronitrosyl(N,N,N',N'-tetramethylethylendiamine- κ^2^N,N')ruthenium(II) |
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Formula | C8 H21 N5 O6 Ru |
Calculated formula | C8 H21 N5 O6 Ru |
SMILES | [Ru]1(N=O)([N](C)(C)CC[N]1(C)C)(N(=O)=O)(N(=O)=O)OCC |
Title of publication | A complex containing three different kinds of Ru—N bonds: ethoxydinitronitrosyl(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')ruthenium(II) |
Authors of publication | Albores, Pablo; Chaia, Zulema D.; Baraldo, Luis; Castellano, Ernesto E.; Piro, Oscar E. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 4 |
Pages of publication | m235 - m236 |
a | 7.93 ± 0.002 Å |
b | 7.93 ± 0.002 Å |
c | 20.21 ± 0.009 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 1100.6 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 144 |
Hermann-Mauguin space group symbol | P 31 |
Hall space group symbol | P 31 |
Residual factor for all reflections | 0.035 |
Residual factor for significantly intense reflections | 0.035 |
Weighted residual factors for significantly intense reflections | 0.094 |
Weighted residual factors for all reflections included in the refinement | 0.094 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.145 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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