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Information card for entry 2012653
Preview
Coordinates | 2012653.cif |
---|---|
Structure factors | 2012653.hkl |
Original IUCr paper | HTML |
Chemical name | 1,6-Diaminohexane‒1,1,1-tris(4-hydroxyphenyl)ethane (1/2) |
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Formula | C46 H52 N2 O6 |
Calculated formula | C46 H52 N2 O6 |
SMILES | [NH3+]CCCCCC[NH3+].[O-]c1ccc(cc1)C(C)(c1ccc(O)cc1)c1ccc(O)cc1.C(C)(c1ccc([O-])cc1)(c1ccc(O)cc1)c1ccc(O)cc1 |
Title of publication | Adducts of 1,1,1-tris(4-hydroxyphenyl)ethane with diamines: three-dimensional hydrogen-bonded frameworks formed with 1,6-diaminohexane and 2,2'-bipyridyl |
Authors of publication | Zakaria, Choudhury M.; Ferguson, George; Lough, Alan J.; Glidewell, Christopher |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 4 |
Pages of publication | o204 - o208 |
a | 6.4715 ± 0.0001 Å |
b | 12.2447 ± 0.0003 Å |
c | 13.0098 ± 0.0004 Å |
α | 77.2052 ± 0.001° |
β | 76.6823 ± 0.001° |
γ | 84.3491 ± 0.0016° |
Cell volume | 977.06 ± 0.04 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.054 |
Residual factor for significantly intense reflections | 0.041 |
Weighted residual factors for significantly intense reflections | 0.101 |
Weighted residual factors for all reflections included in the refinement | 0.109 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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