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Information card for entry 2012840
Preview
Coordinates | 2012840.cif |
---|---|
Structure factors | 2012840.hkl |
Original IUCr paper | HTML |
Chemical name | (4-nitrophenylsulfonylmethyl)triphenylstannane |
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Formula | C25 H21 N O4 S Sn |
Calculated formula | C25 H21 N O4 S Sn |
SMILES | N(=O)(=O)c1ccc(cc1)S(=O)(=O)C[Sn](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | (4-Nitrophenylsulfanylmethyl)triphenylstannane and (4-nitrophenylsulfonylmethyl)triphenylstannane: <i>R</i>f̱{_2^2}(<i>X</i>) rings (<i>X</i> is 10, 18 or 24) and C—H···π interactions |
Authors of publication | Skakle, Janet M. S.; Wardell, James L.; Wardell, Solange M. S. V. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 7 |
Pages of publication | m413 - m417 |
a | 6.8715 ± 0.0004 Å |
b | 9.968 ± 0.0005 Å |
c | 17.6403 ± 0.001 Å |
α | 81.0264 ± 0.0019° |
β | 89.4798 ± 0.0019° |
γ | 72.5146 ± 0.0017° |
Cell volume | 1137.42 ± 0.11 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.019 |
Residual factor for significantly intense reflections | 0.018 |
Weighted residual factors for significantly intense reflections | 0.046 |
Weighted residual factors for all reflections included in the refinement | 0.046 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.097 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2012840.html
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Users of the data should acknowledge the original authors of the
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