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Information card for entry 2012944
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Coordinates | 2012944.cif |
---|---|
Structure factors | 2012944.hkl |
Original IUCr paper | HTML |
Common name | Tetrakis(tetraethylammonium) cyclotetravanadate dihydrate |
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Chemical name | Tetrakis(tetraethylammonium) cyclo-tetra-μ-oxo-tetrakis[dioxovanadium(V)] dihydrate |
Formula | C32 H84 N4 O14 V4 |
Calculated formula | C32 H84 N4 O14 V4 |
SMILES | C(C)[N+](CC)(CC)CC.C([N+](CC)(CC)CC)C.[O-][V]1(=O)O[V]([O-])(=O)O[V]([O-])(=O)O[V]([O-])(=O)O1.O.C(C)[N+](CC)(CC)CC.C([N+](CC)(CC)CC)C.O |
Title of publication | (Et~4~N)~4~[V~4~O~12~]·2H~2~O |
Authors of publication | Nakano, Hiroyuki; Ozeki, Tomoji; Yagasaki, Atsushi |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2002 |
Journal volume | 58 |
Journal issue | 9 |
Pages of publication | m464 - m465 |
a | 14.0187 ± 0.0003 Å |
b | 10.5729 ± 0.0002 Å |
c | 16.0212 ± 0.0004 Å |
α | 90° |
β | 103.836 ± 0.001° |
γ | 90° |
Cell volume | 2305.73 ± 0.09 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.125 |
Residual factor for significantly intense reflections | 0.058 |
Weighted residual factors for significantly intense reflections | 0.12 |
Weighted residual factors for all reflections included in the refinement | 0.141 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.915 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2012944.html
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Users of the data should acknowledge the original authors of the
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