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Information card for entry 2013430
Preview
Coordinates | 2013430.cif |
---|---|
Structure factors | 2013430.hkl |
Original IUCr paper | HTML |
Formula | C6 H9 Cl4 N3 Sn |
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Calculated formula | C6 H9 Cl4 N3 Sn |
Title of publication | <i>cis</i>-Bis(acetonitrile)tetrachlorotin(IV) acetonitrile solvate, <i>cis</i>-tetrachlorobis(propiononitrile)tin(IV) propiononitrile solvate, <i>cis</i>-tetrachlorobis(isobutyronitrile)tin(IV), <i>cis</i>-tetrachlorobis(cyclohexanecarbonitrile)tin(IV) and <i>cis</i>-tetrachlorobis(<i>o</i>-toluonitrile)tin(IV), all determined at <i>ca</i> 150K |
Authors of publication | Koutsantonis, George A.; Morien, Travis S.; Skelton, Brian W.; White, Allan H. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 9 |
Pages of publication | m361 - m365 |
a | 10.48 ± 0.002 Å |
b | 13.783 ± 0.002 Å |
c | 9.758 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1409.5 ± 0.4 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 62 |
Hermann-Mauguin space group symbol | P n m a |
Hall space group symbol | -P 2ac 2n |
Residual factor for all reflections | 0.021 |
Residual factor for significantly intense reflections | 0.019 |
Weighted residual factors for all reflections | 0.023 |
Weighted residual factors for all reflections included in the refinement | 0.022 |
Goodness-of-fit parameter for all reflections | 1.183 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.161 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2013430.html
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Users of the data should acknowledge the original authors of the
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