Information card for entry 2013434

Structure parameters

• Formula: C16 H14 Cl4 N2 Sn
• Calculated formula: C16 H14 Cl4 N2 Sn
• SMILES: [Sn](Cl)(Cl)(Cl)(Cl)([N]#Cc1c(C)cccc1)[N]#Cc1c(C)cccc1
• Title of publication: <i>cis</i>-Bis(acetonitrile)tetrachlorotin(IV) acetonitrile solvate, <i>cis</i>-tetrachlorobis(propiononitrile)tin(IV) propiononitrile solvate, <i>cis</i>-tetrachlorobis(isobutyronitrile)tin(IV), <i>cis</i>-tetrachlorobis(cyclohexanecarbonitrile)tin(IV) and <i>cis</i>-tetrachlorobis(<i>o</i>-toluonitrile)tin(IV), all determined at <i>ca</i> 150K
• Authors of publication: Koutsantonis, George A.; Morien, Travis S.; Skelton, Brian W.; White, Allan H.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 2003
• Journal volume: 59
• Journal issue: 9
• Pages of publication: m361 - m365
• a: 15.355 ± 0.001 Å
• b: 7.381 ± 0.0006 Å
• c: 18.083 ± 0.002 Å
• α: 90°
• β: 104.977 ± 0.002°
• γ: 90°
• Cell volume: 1979.8 ± 0.3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.036
• Residual factor for significantly intense reflections: 0.027
• Weighted residual factors for all reflections: 0.037
• Weighted residual factors for all reflections included in the refinement: 0.034
• Goodness-of-fit parameter for all reflections: 0.976
• Goodness-of-fit parameter for all reflections included in the refinement: 0.986
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes