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Information card for entry 2013506
Preview
Coordinates | 2013506.cif |
---|---|
Structure factors | 2013506.hkl |
Original IUCr paper | HTML |
Chemical name | 1,4,8,11-Tetraazoniacyclotetradecane tetrakis-phenylphosphonate dihydrate |
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Formula | C34 H56 N4 O14 P4 |
Calculated formula | C34 H56 N4 O14 P4 |
SMILES | C1C[NH2+]CCC[NH2+]CC[NH2+]CCC[NH2+]1.O.P(=O)(c1ccccc1)(O)[O-].P(=O)(c1ccccc1)([O-])O.O.P(=O)(c1ccccc1)(O)[O-].P(=O)(c1ccccc1)(O)[O-] |
Title of publication | 1,4,8,11-Tetraazoniacyclotetradecane tetrakis(phenylphosphonate) dihydrate forms hydrogen-bonded sheets |
Authors of publication | Bowes, Katharine F.; Ferguson, George; Lough, Alan J.; Glidewell, Christopher |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 8 |
Pages of publication | o461 - o463 |
a | 13.0678 ± 0.0003 Å |
b | 8.7475 ± 0.0002 Å |
c | 17.6106 ± 0.0005 Å |
α | 90° |
β | 90.513 ± 0.0011° |
γ | 90° |
Cell volume | 2013 ± 0.09 Å3 |
Cell temperature | 150 ± 1 K |
Ambient diffraction temperature | 150 ± 1 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0415 |
Residual factor for significantly intense reflections | 0.0328 |
Weighted residual factors for significantly intense reflections | 0.0802 |
Weighted residual factors for all reflections included in the refinement | 0.0852 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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