Information card for entry 2014033
| Chemical name |
N,N,N',N'-Tetramethyldiammonium–succinate–succinic acid (1/1/1) |
| Formula |
C14 H28 N2 O8 |
| Calculated formula |
C14 H28 N2 O8 |
| SMILES |
C(=O)(O)CCC(=O)O.C(=O)([O-])CCC(=O)[O-].C([NH+](C)C)C[NH+](C)C |
| Title of publication |
<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetramethylethylenediammonium–succinate–succinic acid (1/1/1) |
| Authors of publication |
Bruno, Giuseppe; Rotondo, Archimede; De Luca, Lidia; Sammartano, Silvio; Nicoló, Francesco |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
4 |
| Pages of publication |
o287 - o289 |
| a |
5.637 ± 0.0004 Å |
| b |
8.71 ± 0.0008 Å |
| c |
8.8431 ± 0.0006 Å |
| α |
96.219 ± 0.007° |
| β |
93.414 ± 0.006° |
| γ |
97.604 ± 0.007° |
| Cell volume |
426.63 ± 0.06 Å3 |
| Cell temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for significantly intense reflections |
0.0419 |
| Weighted residual factors for all reflections included in the refinement |
0.1169 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.056 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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