Information card for entry 2014679
| Chemical name |
Bis[2,2'-(phenylphosphinediyl)dibenzenethiolato-κ^3^S,P,S']germanium(IV) |
| Formula |
C36 H26 Ge P2 S4 |
| Calculated formula |
C36 H26 Ge P2 S4 |
| SMILES |
c12ccccc1S[Ge]134(Sc5c(cccc5)[P]23c2ccccc2)Sc2c(cccc2)[P]4(c2ccccc2S1)c1ccccc1 |
| Title of publication |
Bis[2,2'-(phenylphosphinediyl)dibenzenethiolato-κ^3^<i>S</i>,<i>P</i>,<i>S</i>']germanium(IV) |
| Authors of publication |
Chiang, Michael Y.; Lin, Jing-Wei; Zeng, Wen-Feng |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
2 |
| Pages of publication |
m84 - m86 |
| a |
11.537 ± 0.004 Å |
| b |
16.729 ± 0.003 Å |
| c |
16.882 ± 0.004 Å |
| α |
90° |
| β |
95.96 ± 0.02° |
| γ |
90° |
| Cell volume |
3240.7 ± 1.5 Å3 |
| Cell temperature |
298 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for significantly intense reflections |
0.0329 |
| Weighted residual factors for all reflections included in the refinement |
0.0939 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.007 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2014679.html