Information card for entry 2014762
| Common name |
345OMT |
| Chemical name |
(E,E)-2,5-Dimethoxy-1,4-bis[2-(3,4,5-trimethoxyphenyl)ethenyl]benzene |
| Formula |
C30 H34 O8 |
| Calculated formula |
C30 H34 O8 |
| SMILES |
COc1cc(/C=C/c2cc(OC)c(c(c2)OC)OC)c(cc1/C=C/c1cc(OC)c(c(c1)OC)OC)OC |
| Title of publication |
(<i>E</i>,<i>E</i>)-2,5-Dimethoxy-1,4-bis[2-(3,4,5-trimethoxyphenyl)ethenyl]benzene |
| Authors of publication |
Vande Velde, Christophe M. L.; Geise, Herman J.; Blockhuys, Frank |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
1 |
| Pages of publication |
o21 - o24 |
| a |
8.778 ± 0.003 Å |
| b |
11.52 ± 0.005 Å |
| c |
14.717 ± 0.006 Å |
| α |
90° |
| β |
118.05 ± 0.03° |
| γ |
90° |
| Cell volume |
1313.4 ± 1 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1417 |
| Residual factor for significantly intense reflections |
0.0534 |
| Weighted residual factors for significantly intense reflections |
0.1131 |
| Weighted residual factors for all reflections included in the refinement |
0.1366 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.064 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
Mokα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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