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Information card for entry 2016411
Preview
Coordinates | 2016411.cif |
---|---|
Structure factors | 2016411.hkl |
Original IUCr paper | HTML |
Chemical name | ethyltriphenylphosphonium bis(2-thioxo-1,3-dithiole-4,5-dithiolato)aurate(III) |
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Formula | C26 H20 Au P S10 |
Calculated formula | C26 H20 Au P S10 |
SMILES | [Au]12(SC3=C(S2)SC(=S)S3)SC2=C(SC(=S)S2)S1.c1ccccc1[P+](c1ccccc1)(c1ccccc1)CC |
Title of publication | Tetraphenylphosphonium bis(2-thioxo-1,3-dithiole-4,5-dithiolato)aurate(III) acetone solvate and ethyltriphenylphosphonium bis(2-thioxo-1,3-dithiole-4,5-dithiolato)aurate(III) |
Authors of publication | Wang, Xin-Qiang; Yu, Wen-Tao; Xu, Dong; Fan, Jian-Dong; Zhang, Guang-Hui; Ren, Quan |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2008 |
Journal volume | 64 |
Journal issue | 1 |
Pages of publication | m46 - m49 |
a | 17.3058 ± 0.0002 Å |
b | 9.9306 ± 0.0001 Å |
c | 19.0668 ± 0.0002 Å |
α | 90° |
β | 103.959 ± 0.001° |
γ | 90° |
Cell volume | 3180 ± 0.06 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0484 |
Residual factor for significantly intense reflections | 0.027 |
Weighted residual factors for significantly intense reflections | 0.0506 |
Weighted residual factors for all reflections included in the refinement | 0.0565 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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