Information card for entry 2018822
Chemical name |
(1<i>R</i><i>S</i>,3<i>R</i><i>S</i>,4<i>R</i><i>S</i>,10<i>S</i><i>R</i>)-2,2,3,10-Tetrabromo-1,2,3,4-tetrahydro-1,4-ethanonaphthalene |
Formula |
C12 H10 Br4 |
Calculated formula |
C12 H10 Br4 |
SMILES |
Br[C@@H]1[C@H]2c3c([C@@H](C1(Br)Br)[C@@H](Br)C2)cccc3.Br[C@H]1[C@@H]2c3c([C@H](C1(Br)Br)[C@H](Br)C2)cccc3 |
Title of publication |
A tetrabromo-1,4-ethanonaphthalene and related dibromo-1,4-ethenonaphthalene |
Authors of publication |
Boeré, René T.; Bender, Christopher O. |
Journal of publication |
Acta Crystallographica Section C |
Year of publication |
2013 |
Journal volume |
69 |
Journal issue |
3 |
Pages of publication |
247 - 250 |
a |
6.9532 ± 0.0004 Å |
b |
8.4323 ± 0.0005 Å |
c |
11.9669 ± 0.0007 Å |
α |
94.706 ± 0.001° |
β |
91.257 ± 0.001° |
γ |
110.892 ± 0.001° |
Cell volume |
652.31 ± 0.07 Å3 |
Cell temperature |
173 ± 2 K |
Ambient diffraction temperature |
173 ± 2 K |
Number of distinct elements |
3 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0245 |
Residual factor for significantly intense reflections |
0.0219 |
Weighted residual factors for significantly intense reflections |
0.0541 |
Weighted residual factors for all reflections included in the refinement |
0.0552 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.051 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2018822.html