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Information card for entry 2019815
Preview
Coordinates | 2019815.cif |
---|---|
Structure factors | 2019815.hkl |
Original IUCr paper | HTML |
Chemical name | Bis(thiourea-κ<i>S</i>)bis(triphenylphosphane-κ<i>P</i>)silver(I) nitrate |
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Formula | C38 H38 Ag N5 O3 P2 S2 |
Calculated formula | C38 H38 Ag N5 O3 P2 S2 |
SMILES | [Ag]([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([S]=C(N)N)[S]=C(N)N.N(=O)(=O)[O-] |
Title of publication | Crystal structure of bis(thiourea-κS)bis(triphenylphosphane-κP)silver(I) nitrate |
Authors of publication | Nawaz, Sidra; Tahir, Muhammad Nawaz; Nadeem, Muhammad Amir; Mehmood, Bushra; Ahmad, Saeed |
Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
Year of publication | 2015 |
Journal volume | 71 |
Journal issue | 2 |
Pages of publication | 220 |
a | 15.0519 ± 0.0006 Å |
b | 15.1758 ± 0.0005 Å |
c | 17.9186 ± 0.0008 Å |
α | 90° |
β | 107.886 ± 0.002° |
γ | 90° |
Cell volume | 3895.2 ± 0.3 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1395 |
Residual factor for significantly intense reflections | 0.0507 |
Weighted residual factors for significantly intense reflections | 0.0663 |
Weighted residual factors for all reflections included in the refinement | 0.0881 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2019815.html
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Users of the data should acknowledge the original authors of the
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