Information card for entry 2019942

Structure parameters

• Common name: Bis[<i>P</i>,<i>P</i>,<i>P</i>',<i>P</i>'-tetraphenylditelluridoimidodiphosphinato-κ^2^<i>Te</i>]tellurium(II)
• Chemical name: 2,2,4,4,8,8,10,10-Octaphenyl-1λ^3^,5,6λ^4^,7λ^3^,11-pentatellura-3,9-diaza-2λ^5^,4λ^5^,8λ^5^,10λ^5^-tetraphosphaspiro[5.5]undeca-1,3,7,9-tetraene
• Formula: C48 H40 N2 P4 Te5
• Calculated formula: C48 H40 N2 P4 Te5
• Title of publication: A square-planar tellurium(II) complex with <i>Te</i>,<i>Te</i>'-chelating ligands
• Authors of publication: Chivers, Tristram; Ritch, Jamie S.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 2015
• Journal volume: 71
• Journal issue: 5
• Pages of publication: 407 - 409
• a: 11.021 ± 0.002 Å
• b: 14.95 ± 0.003 Å
• c: 15.893 ± 0.003 Å
• α: 90°
• β: 113.47 ± 0.03°
• γ: 90°
• Cell volume: 2402 ± 1 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173.15 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0583
• Residual factor for significantly intense reflections: 0.0342
• Weighted residual factors for significantly intense reflections: 0.0717
• Weighted residual factors for all reflections included in the refinement: 0.0825
• Goodness-of-fit parameter for all reflections included in the refinement: 1.078
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes