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Information card for entry 2020414
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Coordinates | 2020414.cif |
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Structure factors | 2020414.hkl |
Original IUCr paper | HTML |
Chemical name | (4<i>R</i>,5<i>R</i>)-4,5-Bis(hydroxydiphenylmethyl)-2,2-dimethyl-1,3-dioxolane‒4,4a,5,6,7,8-hexahydronaphthalen-2(3<i>H</i>)-one‒4a-(hydroperoxymethyl)-4,4a,5,6,7,8-hexahydronaphthalen-2(3<i>H</i>)-one (1/0.85/0.15) |
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Formula | C41 H44 O5.3 |
Calculated formula | C41 H44 O5.298 |
Title of publication | <i>Ab initio</i> X-ray structural characterization of an inclusion compound with a compositionally disordered chiral guest: no prior knowledge of the crystal composition |
Authors of publication | Guzei, Ilia A.; Miles, Kelsey C. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 3 |
Pages of publication | 179 - 183 |
a | 9.5183 ± 0.0005 Å |
b | 9.595 ± 0.0007 Å |
c | 36.207 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3306.7 ± 0.5 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 99.95 K |
Number of distinct elements | 3 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0354 |
Residual factor for significantly intense reflections | 0.0346 |
Weighted residual factors for significantly intense reflections | 0.0871 |
Weighted residual factors for all reflections included in the refinement | 0.0877 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
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