Information card for entry 2020824
| Chemical name |
2,3,5,6-Tetramethylpyrazine–1,3,5-trifluoro-2,4,6-triiodobenzene (1/1) |
| Formula |
C14 H12 F3 I3 N2 |
| Calculated formula |
C14 H12 F3 I3 N2 |
| SMILES |
c1(c(c(c(c(c1F)I)F)I)F)I.Cc1c(C)nc(c(C)n1)C |
| Title of publication |
^13^C and ^19^F solid-state NMR and X-ray crystallographic study of halogen-bonded frameworks featuring nitrogen-containing heterocycles |
| Authors of publication |
Szell, Patrick M. J.; Gabriel, Shaina A.; Gill, Russell D. D.; Wan, Shirley Y. H.; Gabidullin, Bulat; Bryce, David L. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
3 |
| Pages of publication |
157 - 167 |
| a |
7.9818 ± 0.0003 Å |
| b |
26.7046 ± 0.0009 Å |
| c |
9.222 ± 0.0003 Å |
| α |
90° |
| β |
115.398 ± 0.002° |
| γ |
90° |
| Cell volume |
1775.69 ± 0.11 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0326 |
| Residual factor for significantly intense reflections |
0.029 |
| Weighted residual factors for significantly intense reflections |
0.0659 |
| Weighted residual factors for all reflections included in the refinement |
0.0674 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.185 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2020824.html