Information card for entry 2020826
| Chemical name |
1,10-Phenanthroline–1,3,5-trifluoro-2,4,6-triiodobenzene (1/1) |
| Formula |
C18 H8 F3 I3 N2 |
| Calculated formula |
C18 H8 F3 I3 N2 |
| SMILES |
c1(c(c(c(c(c1F)I)F)I)F)I.c1ccc2ccc3cccnc3c2n1 |
| Title of publication |
^13^C and ^19^F solid-state NMR and X-ray crystallographic study of halogen-bonded frameworks featuring nitrogen-containing heterocycles |
| Authors of publication |
Szell, Patrick M. J.; Gabriel, Shaina A.; Gill, Russell D. D.; Wan, Shirley Y. H.; Gabidullin, Bulat; Bryce, David L. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
3 |
| Pages of publication |
157 - 167 |
| a |
8.6445 ± 0.0003 Å |
| b |
14.0472 ± 0.0006 Å |
| c |
15.8147 ± 0.0006 Å |
| α |
90° |
| β |
97.662 ± 0.002° |
| γ |
90° |
| Cell volume |
1903.25 ± 0.13 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0283 |
| Residual factor for significantly intense reflections |
0.0251 |
| Weighted residual factors for significantly intense reflections |
0.0572 |
| Weighted residual factors for all reflections included in the refinement |
0.0592 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.148 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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