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Information card for entry 2022024
Preview
Coordinates | 2022024.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H11 N O3 |
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Calculated formula | C16 H11 N O3 |
SMILES | O1C(=O)C(=C(\N)c2ccccc2)\C(=O)c2ccccc12 |
Title of publication | TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data |
Authors of publication | Jha, Kunal Kumar; Gruza, Barbara; Kumar, Prashant; Chodkiewicz, Michal Leszek; Dominiak, Paulina Maria |
Journal of publication | Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 3 |
a | 12.925 ± 0.003 Å |
b | 8.273 ± 0.002 Å |
c | 23.954 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2561.4 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0369 |
Residual factor for significantly intense reflections | 0.031 |
Weighted residual factors for significantly intense reflections | 0.082 |
Weighted residual factors for all reflections included in the refinement | 0.0856 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.0595 |
Diffraction radiation wavelength | 0.6 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2022024.html
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structural data.