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Information card for entry 2022031
Preview
Coordinates | 2022031.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C17 H21 N O4 |
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Calculated formula | C17 H21 N O4 |
SMILES | Oc1ccc2C[C@H]3N(CC[C@@]45[C@@H](Oc1c24)[C@@H](O)C=C[C@@H]35)C.O |
Title of publication | TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data |
Authors of publication | Jha, Kunal Kumar; Gruza, Barbara; Kumar, Prashant; Chodkiewicz, Michal Leszek; Dominiak, Paulina Maria |
Journal of publication | Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 3 |
a | 7.431 ± 0.006 Å |
b | 13.769 ± 0.009 Å |
c | 14.944 ± 0.013 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1529 ± 2 Å3 |
Cell temperature | 25 K |
Ambient diffraction temperature | 25 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0178 |
Residual factor for significantly intense reflections | 0.0147 |
Weighted residual factors for significantly intense reflections | 0.0318 |
Weighted residual factors for all reflections included in the refinement | 0.0324 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.7185 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKa |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2022031.html
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Users of the data should acknowledge the original authors of the
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