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Information card for entry 2022065
Preview
Coordinates | 2022065.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C6 H16 Cl2 N2 O3 |
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Calculated formula | C6 H16 Cl2 N2 O3 |
SMILES | [Cl-].[Cl-].OC(=O)[C@@H]([NH3+])CC[C@@H](O)C[NH3+] |
Title of publication | TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data |
Authors of publication | Jha, Kunal Kumar; Gruza, Barbara; Kumar, Prashant; Chodkiewicz, Michal Leszek; Dominiak, Paulina Maria |
Journal of publication | Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 3 |
a | 8.6224 ± 0.0002 Å |
b | 7.0489 ± 0.0002 Å |
c | 9.8061 ± 0.0002 Å |
α | 90° |
β | 106.486 ± 0.002° |
γ | 90° |
Cell volume | 571.5 ± 0.02 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0369 |
Residual factor for significantly intense reflections | 0.0248 |
Weighted residual factors for significantly intense reflections | 0.0479 |
Weighted residual factors for all reflections included in the refinement | 0.0556 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.0417 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2022065.html
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Users of the data should acknowledge the original authors of the
structural data.