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Information card for entry 2022823
Preview
Coordinates | 2022823.cif |
---|---|
Structure factors | 2022823.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-<i>N</i>-{2-[2-(Benzo[<i>b</i>]thiophen-2-yl)ethenyl]-5-fluorophenyl}benzenesulfonamide |
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Formula | C22 H16 F N O2 S2 |
Calculated formula | C22 H16 F N O2 S2 |
Title of publication | Crystal-structure determination and Hirshfeld surface analysis of two new thiophene derivatives: (E)-N-{2-[2-(benzo[b]thiophen-2-yl)ethenyl]-5-fluorophenyl}benzenesulfonamide and (E)-N-{2-[2-(benzo[b]thiophen-2-yl)ethenyl]-5-fluorophenyl}-N-(but-2-yn-1-yl)benzenesulfonamide |
Authors of publication | Madhan, S.; NizamMohideen, M.; Pavunkumar, Vinayagam; MohanaKrishnan, Arasambattu K. |
Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
Year of publication | 2023 |
Journal volume | 79 |
Journal issue | 8 |
a | 7.9588 ± 0.0001 Å |
b | 25.984 ± 0.0004 Å |
c | 9.5178 ± 0.0002 Å |
α | 90° |
β | 96.853 ± 0.001° |
γ | 90° |
Cell volume | 1954.23 ± 0.06 Å3 |
Cell temperature | 297 ± 2 K |
Ambient diffraction temperature | 297 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0525 |
Residual factor for significantly intense reflections | 0.0415 |
Weighted residual factors for significantly intense reflections | 0.1032 |
Weighted residual factors for all reflections included in the refinement | 0.1152 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2022823.html
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