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Information card for entry 2023328
Preview
Coordinates | 2023328.cif |
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Original IUCr paper | HTML |
Chemical name | <i>N</i>-{[3-Bromo-1-(phenylsulfonyl)-1<i>H</i>-indol-2-yl]methyl}-<i>N</i>-(4-bromo-3-methoxyphenyl)benzenesulfonamide |
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Formula | C28 H22 Br2 N2 O5 S2 |
Calculated formula | C28 H22 Br2 N2 O5 S2 |
Title of publication | The crystal structures determination and Hirshfeld surface analysis of N-(4-bromo-3-methoxyphenyl)- and N-{[3-bromo-1-(phenylsulfonyl)-1H-indol-2-yl]methyl}- derivatives of N-{[3-bromo-1-(phenylsulfonyl)-1H-indol-2-yl]methyl}benzenesulfonamide |
Authors of publication | Madhan, S.; NizamMohideen, M.; Pavunkumar, Vinayagam; MohanaKrishnan, Arasambattu K. |
Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
Year of publication | 2024 |
Journal volume | 80 |
Journal issue | 11 |
Pages of publication | 1110 - 1117 |
a | 9.5718 ± 0.0006 Å |
b | 14.4498 ± 0.0008 Å |
c | 20.0041 ± 0.0012 Å |
α | 90° |
β | 92.874 ± 0.002° |
γ | 90° |
Cell volume | 2763.3 ± 0.3 Å3 |
Cell temperature | 303 ± 2 K |
Ambient diffraction temperature | 303 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0568 |
Residual factor for significantly intense reflections | 0.0403 |
Weighted residual factors for significantly intense reflections | 0.0888 |
Weighted residual factors for all reflections included in the refinement | 0.0992 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2023328.html
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Users of the data should acknowledge the original authors of the
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