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Information card for entry 2023415
Preview
| Coordinates | 2023415.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 4-Fluorobenzo[<i>c</i>][1,2,5]selenadiazol-1-ium chloride |
|---|---|
| Formula | C6 H4 Cl F N2 Se |
| Calculated formula | C6 H4 Cl F N2 Se |
| SMILES | [se]1nc2c([nH+]1)cccc2F.[Cl-] |
| Title of publication | Synthesis, crystal structure, Hirshfeld surface and crystal void analysis of 4-fluoro-benzo[<i>c</i>][1,2,5]selena-diazol-1-ium chloride. |
| Authors of publication | Gurbanov, Atash V.; Hökelek, Tuncer; Mammadova, Gunay Z.; Hasanov, Khudayar I.; Javadzade, Tahir A.; Belay, Alebel N. |
| Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
| Year of publication | 2025 |
| Journal volume | 81 |
| Journal issue | Pt 3 |
| Pages of publication | 252 - 256 |
| a | 6.889 ± 0.004 Å |
| b | 7.25 ± 0.005 Å |
| c | 15.183 ± 0.01 Å |
| α | 90° |
| β | 90.9 ± 0.03° |
| γ | 90° |
| Cell volume | 758.2 ± 0.8 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0325 |
| Residual factor for significantly intense reflections | 0.025 |
| Weighted residual factors for significantly intense reflections | 0.0521 |
| Weighted residual factors for all reflections included in the refinement | 0.0551 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.069 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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