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Information card for entry 2100165
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Coordinates | 2100165.cif |
---|---|
Original IUCr paper | HTML |
Formula | C9 H9 N3 O5 |
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Calculated formula | C9 H9 N3 O5 |
Title of publication | A third blind test of crystal structure prediction |
Authors of publication | Day, G. M.; Motherwell, W. D. S.; Ammon, H. L.; Boerrigter, S. X. M.; Della Valle, R. G.; Venuti, E.; Dzyabchenko, A.; Dunitz, J. D.; Schweizer, B.; van Eijck, B. P.; Erk, P.; Facelli, J. C.; Bazterra, V. E.; Ferraro, M. B.; Hofmann, D. W. M.; Leusen, F. J. J.; Liang, C.; Pantelides, C. C.; Karamertzanis, P. G.; Price, S. L.; Lewis, T. C.; Nowell, H.; Torrisi, A.; Scheraga, H. A.; Arnautova, Y. A.; Schmidt, M. U.; Verwer, P. |
Journal of publication | Acta Crystallographica Section B |
Year of publication | 2005 |
Journal volume | 61 |
Journal issue | 5 |
Pages of publication | 511 - 527 |
a | 12.5693 ± 0.0004 Å |
b | 4.8531 ± 0.0001 Å |
c | 17.2663 ± 0.0005 Å |
α | 90° |
β | 99.1624 ± 0.0015° |
γ | 90° |
Cell volume | 1039.81 ± 0.05 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0424 |
Residual factor for significantly intense reflections | 0.0317 |
Weighted residual factors for all reflections | 0.0837 |
Weighted residual factors for significantly intense reflections | 0.078 |
Weighted residual factors for all reflections included in the refinement | 0.078 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.0388 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2100165.html
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Users of the data should acknowledge the original authors of the
structural data.