Crystallography Open Database

Information card for entry 2102170

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Coordinates	2102170.cif
Original IUCr paper	HTML

Structure parameters

Formula	Hf0.01 O24 Si Zr0.99
Calculated formula	Hf0.01 O4 Si Zr0.99
Title of publication	Localized defects in radiation-damaged zircon
Authors of publication	Ríos, Susana; Malcherek, Thomas; Salje, Ekhard K. H.; Domeneghetti, Chiara
Journal of publication	Acta Crystallographica Section B
Year of publication	2000
Journal volume	56
Journal issue	6
Pages of publication	947 - 952
a	6.618 ± 0.003 Å
b	6.618 ± 0.003 Å
c	6.019 ± 0.003 Å
α	90°
β	90°
γ	90°
Cell volume	263.6 ± 0.2 Å³
Cell temperature	293 ± 2 K
Ambient diffraction temperature	293 ± 2 K
Number of distinct elements	4
Space group number	141
Hermann-Mauguin space group symbol	I 41/a m d :2
Hall space group symbol	-I 4bd 2
Residual factor for all reflections	0.0162
Residual factor for significantly intense reflections	0.0157
Weighted residual factors for significantly intense reflections	0.0392
Weighted residual factors for all reflections included in the refinement	0.0395
Goodness-of-fit parameter for all reflections included in the refinement	1.204
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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