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Information card for entry 2102683
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Coordinates | 2102683.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Trans-(di(N,N-diethyl-(2-phenyldiazenyl)thioformamide-κS,κN^2^))nickel |
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Formula | C22 H30 N6 Ni S2 |
Calculated formula | C22 H30 N6 Ni S2 |
SMILES | [Ni]12([S]=C(N=[N]1c1ccccc1)N(CC)CC)[S]=C(N=[N]2c1ccccc1)N(CC)CC |
Title of publication | Structural study of four complexes of the <i>M</i>-N~2~S~2~ type derived from diethylphenylazothioformamide and the metals palladium, platinum, copper and nickel |
Authors of publication | Nielsen, Kim T.; Harris, Pernille; Bechgaard, Klaus; Krebs, Frederik C. |
Journal of publication | Acta Crystallographica Section B |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 1 |
Pages of publication | 151 - 156 |
a | 10.2852 ± 0.0003 Å |
b | 10.2852 ± 0.0003 Å |
c | 22.2862 ± 0.0013 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2357.55 ± 0.17 Å3 |
Cell temperature | 118 ± 2 K |
Ambient diffraction temperature | 118 K |
Number of distinct elements | 5 |
Space group number | 92 |
Hermann-Mauguin space group symbol | P 41 21 2 |
Hall space group symbol | P 4abw 2nw |
Residual factor for all reflections | 0.0373 |
Residual factor for significantly intense reflections | 0.0342 |
Weighted residual factors for significantly intense reflections | 0.0771 |
Weighted residual factors for all reflections included in the refinement | 0.0781 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.158 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2102683.html
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