Crystallography Open Database

Information card for entry 2103923

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Structure parameters

Formula	O8 V4 Y
Title of publication	Structural characterization of YV~4~O~8~: simultaneous analysis of coexisting polytypes and simulation of diffuse scattering for a stacking disorder model
Authors of publication	Onoda, Mitsuko; Dhaussy, Anne-Claire; Kanke, Yasushi
Journal of publication	Acta Crystallographica Section B
Year of publication	2003
Journal volume	59
Journal issue	4
Pages of publication	429 - 438
a	9.109 ± 0.001 Å
b	10.687 ± 0.001 Å
c	2.887 ± 0.001 Å
α	90°
β	90°
γ	90°
Cell volume	281.04 ± 0.11 Å³
Cell temperature	293 K
Ambient diffraction temperature	293 K
Number of distinct elements	3
Residual factor for significantly intense reflections	0.046
Weighted residual factors for significantly intense reflections	0.055
Diffraction radiation wavelength	0.7093 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	Yes

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