Information card for entry 2104226

Structure parameters

• Formula: Co2 O4 Si
• Calculated formula: Co2 O4 Si
• Title of publication: Structural behaviour of synthetic Co~2~SiO~4~ at low temperatures
• Authors of publication: Sazonov, Andrew; Meven, Martin; Hutanu, Vladimir; Kaiser, Volker; Heger, Gernot; Trots, Dmytro; Merz, Michael
• Journal of publication: Acta Crystallographica Section B
• Year of publication: 2008
• Journal volume: 64
• Journal issue: 6
• Pages of publication: 661 - 668
• a: 10.3005 ± 0.0001 Å
• b: 6.0028 ± 0.0001 Å
• c: 4.7816 ± 0.0001 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 295.655 ± 0.008 ų
• Cell temperature: 300 K
• Ambient diffraction temperature: 300 K
• Number of distinct elements: 3
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.0623
• Residual factor for significantly intense reflections: 0.0337
• Weighted residual factors for all reflections: 0.057
• Weighted residual factors for significantly intense reflections: 0.0544
• Weighted residual factors for all reflections included in the refinement: 0.0544
• Goodness-of-fit parameter for all reflections: 1.28
• Goodness-of-fit parameter for significantly intense reflections: 0.75
• Goodness-of-fit parameter for all reflections included in the refinement: 0.75
• Diffraction radiation probe: neutron
• Diffraction radiation wavelength: 0.552 Å
• Diffraction radiation type: constantwavelengthneutrondiffraction
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No