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Information card for entry 2105779
Preview
Coordinates | 2105779.cif |
---|---|
Structure factors | 2105779.hkl |
Original IUCr paper | HTML |
Formula | C28 H8 F4 I4 N4 S12 |
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Calculated formula | C28 H8 F4 I4 N4 S12 |
SMILES | IC1=C(I)SC(=C2SC3=C(S2)SCCS3)S1.IC1=C(I)SC(=C2SC3=C(S2)SCCS3)S1.N#CC(=c1c(F)c(F)c(=C(C#N)C#N)c(c1F)F)C#N |
Title of publication | C—I···NC halogen bonding in two polymorphs of the mixed-valence 2:1 charge-transfer salt (EDT-TTF-I~2~)~2~(TCNQF~4~), with segregated <i>versus</i> alternated stacks |
Authors of publication | Lieffrig, Julien; Jeannin, Olivier; Vacher, Antoine; Lorcy, Dominique; Auban-Senzier, Pascale; Fourmigué, Marc |
Journal of publication | Acta Crystallographica Section B |
Year of publication | 2014 |
Journal volume | 70 |
Journal issue | 1 |
Pages of publication | 141 - 148 |
a | 11.003 ± 0.0004 Å |
b | 12.7689 ± 0.0004 Å |
c | 14.9201 ± 0.0005 Å |
α | 104.906 ± 0.002° |
β | 106.449 ± 0.002° |
γ | 95.863 ± 0.002° |
Cell volume | 1907.83 ± 0.12 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0969 |
Residual factor for significantly intense reflections | 0.0571 |
Weighted residual factors for significantly intense reflections | 0.1406 |
Weighted residual factors for all reflections included in the refinement | 0.1617 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2105779.html
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Users of the data should acknowledge the original authors of the
structural data.