Information card for entry 2108413

Structure parameters

• Formula: C52 H44 P2 S2
• Calculated formula: C52 H44 P2 S2
• Title of publication: Comparison of different strategies for modelling hydrogen atoms in charge density analyses
• Authors of publication: Köhler, Christian; Lübben, Jens; Krause, Lennard; Hoffmann, Christina; Herbst-Irmer, Regine; Stalke, Dietmar
• Journal of publication: Acta Crystallographica Section B
• Year of publication: 2019
• Journal volume: 75
• Journal issue: 3
• a: 10.7687 Å
• b: 14.7934 Å
• c: 13.4133 Å
• α: 90°
• β: 103.813°
• γ: 90°
• Cell volume: 2075.02 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0269
• Residual factor for significantly intense reflections: 0.0269
• Weighted residual factors for all reflections: 0.0164
• Weighted residual factors for significantly intense reflections: 0.0164
• RFsqd: 0.0264
• Goodness-of-fit parameter for all reflections: 1.938
• Goodness-of-fit parameter for significantly intense reflections: 1.938
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes