Information card for entry 2200115
Formula |
C32 H50 O |
Calculated formula |
C32 H50 O |
SMILES |
O([C@@H]1C(=C)CC[C@]23[C@H]1C(CCC[C@]2(C3)C)(C)C)[C@@H]1C(=CC[C@]23[C@H]1C(CCC[C@]2(C3)C)(C)C)C |
Title of publication |
(1<i>S</i>,3<i>S</i>,8<i>R</i>,9<i>S</i>)-3,7,7,10-Tétraméthyl-9-[(1<i>S</i>,3<i>S</i>,8<i>R</i>,9<i>S</i>)-3,7,7-triméthyl-10-méthylènetricyclo[6,4,0,0^1,3^]dodéc-9-yloxy]tricyclo[6,4,0,0^1,3^]dodéc-10-ène |
Authors of publication |
Auhmani, A.; Kossareva, E.; Eljamili, H.; Reglier, M.; Pierrot, M.; Benharref, A. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2001 |
Journal volume |
57 |
Journal issue |
2 |
Pages of publication |
o102 - o103 |
a |
8.7475 ± 0.0002 Å |
b |
15.553 ± 0.001 Å |
c |
20.359 ± 0.001 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2769.8 ± 0.2 Å3 |
Cell temperature |
298 K |
Number of distinct elements |
3 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.098 |
Residual factor for significantly intense reflections |
0.086 |
Weighted residual factors for all reflections |
0.06 |
Weighted residual factors for all reflections included in the refinement |
0.051 |
Goodness-of-fit parameter for all reflections |
2.12 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.87 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2200115.html