Information card for entry 2200334
Chemical name |
trans-bis(Triphenylphosphine)bis(4,4,4-trifluoro-1-phenyl- 1,3-butanedionato-O,O')nickel(II) |
Formula |
C56 H42 F6 Ni O4 P2 |
Calculated formula |
C56 H42 F6 Ni O4 P2 |
SMILES |
FC(F)(F)C1=[O][Ni]2(OC(=C1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[O]=C(C(F)(F)F)C=C(O2)c1ccccc1 |
Title of publication |
<i>trans</i>-Bis(4,4,4-trifluoro-1-phenyl-1,3-butanedionato-<i>O</i>,<i>O</i>')bis(triphenylphosphine-<i>P</i>)nickel(II) at 173K |
Authors of publication |
Dickman, Michael H. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2001 |
Journal volume |
57 |
Journal issue |
6 |
Pages of publication |
m220 - m221 |
a |
10.7917 ± 0.0014 Å |
b |
11.0583 ± 0.0014 Å |
c |
11.7156 ± 0.0015 Å |
α |
63.282 ± 0.002° |
β |
77.173 ± 0.002° |
γ |
71.153 ± 0.002° |
Cell volume |
1177 ± 0.3 Å3 |
Cell temperature |
171 ± 2 K |
Ambient diffraction temperature |
171 ± 2 K |
Number of distinct elements |
6 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0532 |
Residual factor for significantly intense reflections |
0.0407 |
Weighted residual factors for all reflections included in the refinement |
0.1086 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.012 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2200334.html