Information card for entry 2200800
Chemical name |
1,4:2,3-bis(μ-2,4,6-trimethylphenyl-C:C)-1,2:3,4-bis[μ- bis(trimethylsilyl)amido-N:N]tetracopper(I) |
Formula |
C30 H58 Cu4 N2 Si4 |
Calculated formula |
C30 H58 Cu4 N2 Si4 |
SMILES |
[Cu]123[Cu]4([Cu]5([Cu]1([N]5([Si](C)(C)C)[Si](C)(C)C)[c]13c(cc(cc1C)C)C)[c]14c(cc(cc1C)C)C)[N]2([Si](C)(C)C)[Si](C)(C)C |
Title of publication |
A heteroleptic tetranuclear copper amide/aryl complex: 1,4:2,3-bis(μ-2,4,6-trimethylphenyl-<i>C</i>,<i>C</i>)-1,2:3,4-bis[μ-bis(trimethylsilyl)amido-<i>N</i>,<i>N</i>]tetracopper(I) |
Authors of publication |
Niemeyer, Mark |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2001 |
Journal volume |
57 |
Journal issue |
10 |
Pages of publication |
m491 - m493 |
a |
9.171 ± 0.002 Å |
b |
11.353 ± 0.002 Å |
c |
20.314 ± 0.004 Å |
α |
101.98 ± 0.01° |
β |
94.56 ± 0.02° |
γ |
107.28 ± 0.02° |
Cell volume |
1952.9 ± 0.7 Å3 |
Cell temperature |
173 ± 2 K |
Ambient diffraction temperature |
173 ± 2 K |
Number of distinct elements |
5 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.047 |
Residual factor for significantly intense reflections |
0.037 |
Weighted residual factors for all reflections included in the refinement |
0.101 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.07 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2200800.html