Information card for entry 2201778
| Chemical name |
2,7-Dimethyl-4,5-bis(trimethylsilyl)octa-2,3,5,6-tetraene |
| Formula |
C16 H30 Si2 |
| Calculated formula |
C16 H30 Si2 |
| SMILES |
C(=C=C([Si](C)(C)C)C(=C=C(C)C)[Si](C)(C)C)(C)C |
| Title of publication |
2,7-Dimethyl-4,5-bis(trimethylsilyl)octa-2,3,5,6-tetraene |
| Authors of publication |
Jones, Peter G.; Bubenitschek, Peter; Hopf, Henning; Stamm, Reiner |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2003 |
| Journal volume |
59 |
| Journal issue |
2 |
| Pages of publication |
o119 - o120 |
| a |
6.363 ± 0.002 Å |
| b |
8.963 ± 0.002 Å |
| c |
9.157 ± 0.003 Å |
| α |
70.76 ± 0.02° |
| β |
72.13 ± 0.02° |
| γ |
83.41 ± 0.02° |
| Cell volume |
469.2 ± 0.2 Å3 |
| Cell temperature |
178 ± 2 K |
| Ambient diffraction temperature |
178 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.064 |
| Residual factor for significantly intense reflections |
0.0423 |
| Weighted residual factors for significantly intense reflections |
0.1032 |
| Weighted residual factors for all reflections included in the refinement |
0.1149 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.019 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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