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Information card for entry 2202124
Preview
Coordinates | 2202124.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Bis(thiosemicarbazido-κ^2^N,S)nickel(II)‒succinate‒succinic acid (1/1/1) |
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Formula | C10 H20 N6 Ni O8 S2 |
Calculated formula | C10 H20 N6 Ni O8 S2 |
SMILES | C1(N[NH2][Ni]2([S]=1)[NH2]NC(N)=[S]2)N.C(C(=O)O)CC(=O)O.[O-]C(=O)CCC(=O)[O-] |
Title of publication | Bis(thiosemicarbazido-κ^2^<i>N,S</i>)nickel(II)‒succinate‒succinic acid (1/1/1) |
Authors of publication | Sheng-Li Li; Anwar Usman; Ibrahim A. Razak; Azhar A. Rahman; Hoong-Kun Fun; Jie-Ying Wu; Yu-Peng Tian; Min-Hua Jiang; Zu-Yao Chen |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 4 |
Pages of publication | m199 - m201 |
a | 6.3886 ± 0.0003 Å |
b | 8.4876 ± 0.0003 Å |
c | 8.9485 ± 0.0003 Å |
α | 102.688 ± 0.001° |
β | 107.056 ± 0.001° |
γ | 98.926 ± 0.001° |
Cell volume | 439.83 ± 0.03 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0742 |
Residual factor for significantly intense reflections | 0.0652 |
Weighted residual factors for significantly intense reflections | 0.1676 |
Weighted residual factors for all reflections included in the refinement | 0.1737 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.011 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202124.html
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Users of the data should acknowledge the original authors of the
structural data.