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Information card for entry 2202316
Preview
Coordinates | 2202316.cif |
---|---|
Structure factors | 2202316.hkl |
Original IUCr paper | HTML |
Chemical name | 7-Isopropylidenenorborna-2,5-diene-2,3,5,6-tetracarboxylic acid tetrakis(phenylamide) |
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Formula | C38 H32 N4 O4 |
Calculated formula | C38 H32 N4 O4 |
SMILES | CC(=C1C2C(=C(C1C(=C2C(=O)Nc1ccccc1)C(=O)Nc1ccccc1)C(=O)Nc1ccccc1)C(=O)Nc1ccccc1)C |
Title of publication | A tetrakis(secondary amide) derivative of norbornadiene: 7-isopropylidene-<i>N,N</i>',<i>N</i>'',<i>N</i>'''-tetraphenylnorborna-2,5-diene-2,3,5,6-tetracarboxamide |
Authors of publication | Winkler, Torsten; Herges, Rainer; Jones, Peter G.; Dix, Ina |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 7 |
Pages of publication | o994 - o996 |
a | 26.8424 ± 0.0016 Å |
b | 7.8024 ± 0.0006 Å |
c | 14.8652 ± 0.001 Å |
α | 90° |
β | 104.708 ± 0.003° |
γ | 90° |
Cell volume | 3011.3 ± 0.4 Å3 |
Cell temperature | 143 ± 2 K |
Ambient diffraction temperature | 143 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0494 |
Residual factor for significantly intense reflections | 0.0427 |
Weighted residual factors for significantly intense reflections | 0.1131 |
Weighted residual factors for all reflections included in the refinement | 0.1187 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202316.html
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