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Information card for entry 2202324
Preview
Coordinates | 2202324.cif |
---|---|
Structure factors | 2202324.hkl |
Original IUCr paper | HTML |
Chemical name | 3-Isopropylidene-tetracyclo[3.2.0.0^2,7^.0^4,6^]heptan-1,5,6,7- tetracarboxylic acid tetrakis(diethylamide) |
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Formula | C30 H48 N4 O4 |
Calculated formula | C30 H48 N4 O4 |
SMILES | CCN(C(=O)[C@]12C3[C@@]1(C(=O)N(CC)CC)[C@@]1([C@@]2(C(=O)N(CC)CC)C1C3=C(C)C)C(=O)N(CC)CC)CC |
Title of publication | A tetrakis(tertiary amide) derivative of quadricyclane: 3-isopropylidene-tetracyclo[3.2.0.0^2,7^.0^4,6^]heptan-1,5,6,7-tetracarboxylic acid tetrakis(diethylamide) |
Authors of publication | Winkler, Torsten; Herges, Rainer; Jones, Peter G.; Dix, Ina |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 8 |
Pages of publication | o1103 - o1105 |
a | 10.8375 ± 0.0008 Å |
b | 11.6922 ± 0.0008 Å |
c | 13.7337 ± 0.001 Å |
α | 109.065 ± 0.003° |
β | 101.073 ± 0.003° |
γ | 106.8 ± 0.003° |
Cell volume | 1493.6 ± 0.2 Å3 |
Cell temperature | 133 ± 2 K |
Ambient diffraction temperature | 133 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0606 |
Residual factor for significantly intense reflections | 0.0418 |
Weighted residual factors for significantly intense reflections | 0.1073 |
Weighted residual factors for all reflections included in the refinement | 0.1164 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202324.html
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