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Information card for entry 2202452
Preview
Coordinates | 2202452.cif |
---|---|
Structure factors | 2202452.hkl |
Original IUCr paper | HTML |
Chemical name | [(S)-(-)-2-aminomethyl-1-ethylpyrrolidine- κ^2^N,N'](1,5-cyclooctadiene)rhodium(I) trifluoromethanesulfonate |
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Formula | C16 H28 F3 N2 O3 Rh S |
Calculated formula | C16 H28 F3 N2 O3 Rh S |
SMILES | [Rh]1234([NH2]C[C@H]5[N]1(CC)CCC5)[CH]1=[CH]2CC[CH]3=[CH]4CC1.S(=O)(=O)([O-])C(F)(F)F |
Title of publication | A new polymorph of [(<i>S</i>)-({-})-2-aminomethyl-1-ethylpyrrolidine-κ^2^<i>N,N</i>'](1,5-cyclooctadiene)rhodium(I) trifluoromethanesulfonate |
Authors of publication | Jones, Matthew D.; Almeida Paz, Filipe A.; Davies, John E.; Johnson, Brian F. G.; Klinowski, Jacek |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 12 |
Pages of publication | m1091 - m1093 |
a | 11.7449 ± 0.0005 Å |
b | 14.5747 ± 0.0007 Å |
c | 22.97 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3932 ± 0.3 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 7 |
Space group number | 20 |
Hermann-Mauguin space group symbol | C 2 2 21 |
Hall space group symbol | C 2c 2 |
Residual factor for all reflections | 0.0482 |
Residual factor for significantly intense reflections | 0.0407 |
Weighted residual factors for significantly intense reflections | 0.096 |
Weighted residual factors for all reflections included in the refinement | 0.1014 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202452.html
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