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Information card for entry 2202686
Preview
Coordinates | 2202686.cif |
---|---|
Structure factors | 2202686.hkl |
Original IUCr paper | HTML |
Chemical name | Bis(tetraphenylphosphonium) bis(2-oxo-1,3-dithiole-4,5-dithiolato)zincate(II) |
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Formula | C54 H40 O2 P2 S8 Zn |
Calculated formula | C54 H40 O2 P2 S8 Zn |
SMILES | [Zn]12(SC3=C(S1)SC(=O)S3)SC1=C(S2)SC(=O)S1.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Bis(tetraphenylphosphonium) bis(2-oxo-1,3-dithiole-4,5-dithiolato)zincate(II) |
Authors of publication | Candiota, Rafeal O.; Comerlato, Nadia M.; Howie, R. Alan; Wardell, James L. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 8 |
Pages of publication | m599 - m601 |
a | 16.5321 ± 0.0002 Å |
b | 17.3265 ± 0.0002 Å |
c | 17.9862 ± 0.0002 Å |
α | 88.5668 ± 0.0007° |
β | 74.5401 ± 0.0007° |
γ | 87.3795 ± 0.0005° |
Cell volume | 4959.98 ± 0.1 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0729 |
Residual factor for significantly intense reflections | 0.0509 |
Weighted residual factors for significantly intense reflections | 0.1431 |
Weighted residual factors for all reflections included in the refinement | 0.1682 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.099 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202686.html
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Users of the data should acknowledge the original authors of the
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