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Information card for entry 2202767
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Coordinates | 2202767.cif |
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Original IUCr paper | HTML |
Chemical name | Di-μ-acetylacetonato-bis[diacetylacetonato(tert-butylamine)nickel(II)] |
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Formula | C28 H50 N2 Ni2 O8 |
Calculated formula | C28 H50 N2 Ni2 O8 |
SMILES | CC1=CC(=[O][Ni]23([NH2]C(C)(C)C)([O]1[Ni]14([NH2]C(C)(C)C)([O]3C(C)=CC(C)=[O]1)OC(=CC(=[O]4)C)C)OC(=CC(=[O]2)C)C)C |
Title of publication | Di-μ-acetylacetonato-bis[diacetylacetonato(<i>tert</i>-butylamine)nickel(II)] |
Authors of publication | He, Xiao-Hui; Yao, Ying-Zheng; Luo, Xiang; Zhang, Ling; Wu, Qing |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2003 |
Journal volume | 59 |
Journal issue | 12 |
Pages of publication | m1196 - m1197 |
a | 9.073 ± 0.001 Å |
b | 9.141 ± 0.001 Å |
c | 11.513 ± 0.001 Å |
α | 110.555 ± 0.002° |
β | 99.252 ± 0.002° |
γ | 100.637 ± 0.002° |
Cell volume | 851.88 ± 0.15 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.078 |
Residual factor for significantly intense reflections | 0.062 |
Weighted residual factors for significantly intense reflections | 0.176 |
Weighted residual factors for all reflections included in the refinement | 0.193 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202767.html
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