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Information card for entry 2202807
Preview
| Coordinates | 2202807.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C15 H20 N O5 S5 |
|---|---|
| Calculated formula | C15 H20 N O5 S5 |
| SMILES | S1C=CSC1=C1SC=CS1.S(=O)(=O)(ON1C(CC(=O)CC1(C)C)(C)C)[O-] |
| Title of publication | Tetrathiafulvalenium 4-oxo-2,2,6,6-tetramethylpiperidin-1-sulfate |
| Authors of publication | Akutsu, Hiroki; Yamada, Jun-ichi; Nakatsuji, Shin'ichi |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2003 |
| Journal volume | 59 |
| Journal issue | 10 |
| Pages of publication | o1441 - o1443 |
| a | 10.884 ± 0.001 Å |
| b | 12.132 ± 0.002 Å |
| c | 7.948 ± 0.001 Å |
| α | 102.78 ± 0.01° |
| β | 106.02 ± 0.01° |
| γ | 79.52 ± 0.01° |
| Cell volume | 975.5 ± 0.2 Å3 |
| Cell temperature | 296.2 K |
| Ambient diffraction temperature | 296.2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0671 |
| Residual factor for significantly intense reflections | 0.067 |
| Weighted residual factors for all reflections | 0.042 |
| Weighted residual factors for all reflections included in the refinement | 0.042 |
| Goodness-of-fit parameter for all reflections | 1.712 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.71 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2202807.html
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Users of the data should acknowledge the original authors of the
structural data.